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Non-contact measurement of the thickness of fiber membranes such as non-woven fabric - Sample measurement in progress -
Detecting thickness variations in nanofiber non-woven fabric using transmitted light ○ Non-contact real-time high-speed measurement ○ 3D display of fiber surface shape ○ Interchangeable fiber sensors tailored to the target
An industry-standard device boasting a large number of delivery achievements! Equipped with linear array photodetectors.
The "Model3100" is an optical interference film thickness measurement device that employs a linear array sensor for high-speed measurement. By standardly equipping spectral analysis software, it enables simultaneous measurement of multilayer films (typically up to three layers) and measurement of optical constants (n, k). It allows for fine-tuned parameter settings suitable for various film characteristics, enabling more diverse film thickness measurements for various film structures. 【Features】 ■ Capable of measuring up to 70μm in equivalent oxide film thickness with a high-sensitivity, high-resolution head (optional) ■ 100x lens (for a micro spot of φ0.75μm) is also available ■ Easy implementation of program settings for special film measurements suited to the process ■ Supports various applications (magnetic heads, FPD, materials research, etc.) and allows for the creation of sample stages tailored to specific uses (optional) *For more details, please refer to the PDF materials or feel free to contact us.
Infrared Non-Contact Thickness Gauge "Easy Operation and Maintenance-Free!"
<X-Y Mapping Measurement Possible> Mapping measurements can be performed while moving the work in the XY direction. <Ready-to-Use Operability> Automatically creates a calibration curve from the reference piece. Measurement can be started immediately. <Maintenance-Free> There are no short-term replacement parts such as light sources or line sources.
